• Moiré fringes in conductive atomic force microscopy 

      Richarz, Leonie; He, J.; Ludacka, Ursula; Bourret, E.; Yan, Z.; Van Helvoort, Antonius; Meier, Dennis (Journal article; Peer reviewed, 2023)
      Moiré physics plays an important role in characterization of functional materials and engineering of physical properties in general, ranging from strain-driven transport phenomena to superconductivity. Here, we report on ...
    • STEM-based analysis of functional defects in ferroelectric ErMnO3 

      Helvoort, Antonius T. J. van; Mosberg, Aleksander B.; Ludacka, Ursula; Holstad, Theodor Secanell; Evans, Donald M.; Meier, Dennis Gerhard (Peer reviewed; Journal article, 2021)